A Code Transition Delay Model for ADC Test.

Sanjay Mohan Michael L. Bushnell

Published in: VLSI Design (2001)

Keyphrases

theoretical analysis
computational model
formal model
probabilistic model
mathematical model
test data
management system
neural network
high level
conceptual model
prior knowledge
network model
database
statistical model
data model
similarity measure
decision trees
data sets