Efficient test response compaction for robust BIST using parity sequences.

Thomas Indlekofer Michael Schnittger Sybille Hellebrand

Published in: ICCD (2010)

Keyphrases

computationally efficient
computationally expensive
database
real time
computer vision
information systems
data structure
cost effective
learning algorithm
e learning
case study
hidden markov models
least squares
test data
statistical significance