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Impact of short-channel effects on velocity overshoot in MOSFET.

Gaspard HiblotQuentin RafhayFrédéric BoeufGérard Ghibaudo
Published in: NEWCAS (2015)
Keyphrases
  • negative effects
  • positive effects
  • negative impact
  • residual errors
  • interaction effects
  • closed loop
  • multi channel
  • data sets
  • control strategy
  • real time
  • individual level
  • noisy channel