A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory.
Alberto Rodriguez-FernandezJ. Muñoz-GorrizJordi SuñéEnrique MirandaPublished in: Microelectron. Reliab. (2018)
Keyphrases
- high accuracy
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- pairwise
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- computationally efficient
- detection method
- support vector machine
- theoretical analysis
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- clustering method
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- prior knowledge
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