A New Design-for-Testability Method Based on Thru-Testability.
Chia Yee OoiHideo FujiwaraPublished in: J. Electron. Test. (2011)
Keyphrases
- preprocessing
- error rate
- main contribution
- dynamic programming
- computational complexity
- significant improvement
- support vector machine
- high accuracy
- simulated annealing algorithm
- evaluation method
- detection method
- mutual information
- multiresolution
- pairwise
- machine learning
- model selection
- computationally efficient
- support vector machine svm
- optimal solution
- synthetic data
- fully automatic
- similarity measure
- genetic algorithm