An automated system for testing LSI memory chips.
H. D. SchnurmannL. J. VidunasR. M. PetersPublished in: DAC (1984)
Keyphrases
- latent semantic indexing
- search based testing
- semi automated
- memory requirements
- information retrieval
- fully automated
- test data
- test cases
- computer systems
- high speed
- memory usage
- computing power
- limited memory
- high end
- processing elements
- digital signal processors
- data sets
- computer aided
- text retrieval
- associative memory
- integrated circuit
- automated analysis