Fast FMCW Terahertz Imaging for In-Process Defect Detection in Press Sleeves for the Paper Industry and Image Evaluation with a Machine Learning Approach.
Maris BauerRaphael HussungCarsten MatheisHermann ReichertPeter WeichenbergerJens BeckUwe MatuschczykJoachim JonuscheitFabian FriederichPublished in: Sensors (2021)
Keyphrases
- defect detection
- high resolution
- image analysis
- image data
- input image
- multiscale
- image classification
- image features
- evaluation process
- image retrieval
- single image
- imaging technology
- matching process
- image segmentation
- region of interest
- image structure
- image pixels
- image regions
- image processing
- image representation
- acquired images
- imaging process
- synthetic aperture
- imaging model
- image collections
- fluorescence microscopy
- segmentation method
- edge detection
- low level
- test images
- image content
- image matching
- image reconstruction
- imaging systems
- imaging devices
- gray level
- segmentation algorithm
- feature points
- super resolution
- distortion correction
- case study