Comparing drop impact test method using strain gauge measurements.
Y. LiuF. J. H. G. KesselsWillem D. van DrielJ. A. S. van DrielF. L. SunG. Q. ZhangPublished in: Microelectron. Reliab. (2009)
Keyphrases
- computational cost
- detection method
- preprocessing
- fully automatic
- mathematical model
- high accuracy
- error rate
- feature extraction
- dynamic programming
- experimental evaluation
- main contribution
- support vector machine svm
- optimization method
- classification method
- synthetic data
- theoretical analysis
- image quality
- probabilistic model
- cost function
- prior knowledge
- image retrieval
- pairwise