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Cache RAM inductive fault analysis with fab defect modeling.

T. M. MakDebika BhattacharyaCheryl PruntyBob RoederNermine RamadanF. Joel FergusonJianlin Yu
Published in: ITC (1998)
Keyphrases
  • machine learning
  • real time
  • database
  • databases
  • genetic algorithm
  • social networks
  • website
  • data analysis
  • expert systems
  • control system
  • fault diagnosis
  • statistical modeling