Performance, reliability, radiation effects, and aging issues in microelectronics - from atomic-scale physics to engineering-level modeling.
Sokrates T. PantelidesL. TsetserisM. J. BeckS. N. RashkeevG. HadjisavvasI. G. BatyrevB. R. TuttleA. G. MarinopoulosX. J. ZhouDaniel M. FleetwoodRonald D. SchrimpfPublished in: ESSCIRC (2009)