TG-SPP: A One-Transmission-Gate Short-Path Padding for Wide-Voltage-Range Resilient Circuits in 28-nm CMOS.
Weiwei ShanWentao DaiChuan ZhangHao CaiPeiye LiuJun YangLongxing ShiPublished in: IEEE J. Solid State Circuits (2020)
Keyphrases
- cmos technology
- low voltage
- low power
- power consumption
- leakage current
- parallel processing
- wide range
- power dissipation
- random access memory
- high speed
- image sensor
- low cost
- mixed signal
- nm technology
- silicon on insulator
- metal oxide semiconductor
- delay insensitive
- data transmission
- clock gating
- power system
- shortest path
- power management
- link failure
- power supply
- design considerations
- transmission line
- high voltage
- analog vlsi