A total standard WIP estimation method for wafer fabrication.
Yu-Hsin LinChing-En LeePublished in: Eur. J. Oper. Res. (2001)
Keyphrases
- cost function
- detection method
- support vector machine svm
- estimation accuracy
- high precision
- data sets
- experimental evaluation
- preprocessing
- dynamic programming
- significant improvement
- synthetic data
- support vector machine
- edge detection
- detection algorithm
- clustering method
- pairwise
- estimation algorithm
- maximum likelihood estimation