Patch-Wise Deep Metric Learning for Unsupervised Low-Dose CT Denoising.
Chanyong JungJoonhyung LeeSunkyoung YouJong Chul YePublished in: MICCAI (6) (2022)
Keyphrases
- low dose
- metric learning
- denoising
- semi supervised
- pairwise
- computed tomography
- x ray
- ct scans
- imaging modalities
- image denoising
- computer tomography
- lung nodules
- distance metric
- image patches
- natural images
- ct images
- dual energy
- noisy images
- learning tasks
- multi task
- unsupervised learning
- contrast enhancement
- medical imaging
- image processing
- dimensionality reduction
- semi supervised learning
- image reconstruction
- supervised learning
- medical images
- three dimensional
- distance function
- ct data
- gaussian noise
- image segmentation
- intraoperative
- magnetic resonance imaging
- learning algorithm
- multi class
- active learning
- labeled data
- treatment planning
- computer aided diagnosis
- image enhancement
- face recognition
- denoising methods
- pattern recognition
- feature space
- low contrast
- markov random field
- region of interest