Novel Electrical Detection Method for Random Defects on Peripheral Circuits in NAND Flash Memory.
Bu-Il NamYoung-Ha ChoiSungki HongKi-Young DongWontaeck JungSang-Won ParkSoon-Yong LeeDooyeun JungByoung-Hee KimEun-kyoung KimKi-Whan SongJai Hyuk SongWoo Young ChoiPublished in: IRPS (2022)
Keyphrases
- detection method
- flash memory
- garbage collection
- solid state
- random access
- file system
- main memory
- detection algorithm
- small size
- embedded systems
- buffer management
- data storage
- electronic circuits
- feature detection
- b tree
- face detection
- disk drives
- printed circuit boards
- database systems
- storage systems
- storage devices
- hand held devices
- high speed
- transmission line
- low cost
- region detection
- data points
- color images
- data structure
- computer vision
- databases