Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena.
Engin AfacanGünhan DündarI. Faik BaskayaPublished in: Microelectron. Reliab. (2014)
Keyphrases
- reliability assessment
- analog vlsi
- high speed
- cmos image sensor
- circuit design
- low cost
- single chip
- cmos technology
- bp neural network model
- chip design
- image sensor
- random access memory
- power system
- focal plane
- low power
- software systems
- nm technology
- ultra low power
- autonomic computing
- autonomic systems
- power dissipation
- power consumption
- communication systems
- dynamic range
- solid state
- parallel processing
- metal oxide semiconductor
- silicon on insulator
- vlsi implementation
- age estimation
- high density
- low voltage
- low power consumption
- mixed signal
- age related
- machine learning
- software defect
- database systems
- power supply
- neural network
- flip flops
- digital camera
- video camera
- computing systems
- design considerations
- real time