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TSV-Cluster Defect Tolerance Using Tree-Based Redundancy for Yield Improvement of 3-D ICs.
Dilip Kumar Maity
Surajit Kumar Roy
Chandan Giri
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2021)
Keyphrases
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clustering algorithm
cluster analysis
data clustering
data sets
learning algorithm
image processing
multi agent
association rules
multiple description coding