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TSV-Cluster Defect Tolerance Using Tree-Based Redundancy for Yield Improvement of 3-D ICs.

Dilip Kumar MaitySurajit Kumar RoyChandan Giri
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2021)
Keyphrases
  • clustering algorithm
  • cluster analysis
  • data clustering
  • data sets
  • learning algorithm
  • image processing
  • multi agent
  • association rules
  • multiple description coding