Login / Signup
A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits.
Witold A. Pleskacz
Charles H. Ouyang
Wojciech Maly
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
</>
vlsi circuits
k means
detection algorithm
real time
learning algorithm
optimal solution
dynamic programming
probabilistic model
segmentation algorithm
computational complexity
preprocessing
worst case
high speed
markov random field
expectation maximization
matching algorithm