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Arithmetic built-in self test for high-level synthesis.

Nilanjan MukherjeeH. KassabJanusz RajskiJerzy Tyszer
Published in: VTS (1995)
Keyphrases
  • high level synthesis
  • built in self test
  • parallel architecture
  • design space exploration
  • integrated circuit
  • arithmetic operations
  • floating point
  • bayesian networks