Reliability improvements in 50 nm MLC NAND flash memory using short voltage programming pulses.
Fernanda IrreraIvan PiccoliGiuseppina PuzzilliMassimo RossiniTommaso ValiPublished in: Microelectron. Reliab. (2009)
Keyphrases
- flash memory
- solid state
- metal oxide
- garbage collection
- file system
- random access
- buffer management
- main memory
- disk drives
- embedded systems
- database systems
- data storage
- b tree
- power system
- low voltage
- storage systems
- storage devices
- cmos technology
- memory management
- data structure
- small size
- hand held devices
- object oriented
- feature space
- failure rate
- real time
- databases