Login / Signup
Mixed Diagnostics for Longitudinal Properties of Electron Bunches in a Free-Electron Laser.
J. Zhu
N. M. Lockmann
M. K. Czwalinna
H. Schlarb
Published in:
CoRR (2022)
Keyphrases
</>
electron microscopy
electron microscope
databases
electron beam
van der waals
neural network
face recognition
expert systems
topological properties
electric field
high energy
database
information systems
multiscale
multiresolution
x ray