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Low Cost BIST for Static and Dynamic Testing of ADCs.
Maria Da Gloria Flores
Marcelo Negreiros
Luigi Carro
Altamiro Amadeu Susin
Felipe R. Clayton
Cristiano Benevento
Published in:
J. Electron. Test. (2005)
Keyphrases
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low cost
hardware and software
single chip
real time
low power
digital camera
cost effective
test cases
multiresolution
high level
data sets
database
lightweight
training data
data acquisition
three dimensional
test generation