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Electrical Stability of p-Channel Feedback Field-Effect Transistors Under Bias Stresses.
Jaemin Son
Kyoungah Cho
Sangsig Kim
Published in:
IEEE Access (2021)
Keyphrases
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field effect transistors
steady state
high density
schottky barrier
mathematical analysis
chip design
semiconductor devices
variance reduction
relevance feedback
stability analysis
markov chain
power grid
multi channel
user feedback
printed circuit boards
distribution networks
low voltage
real time