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Gate-Level Validation of Integrated Circuits With Structured-Illumination Read-Out of Embedded Optical Signatures.
Negin Zaraee
Boyou Zhou
Kyle Vigil
Mohammad M. Shahjamali
Ajay Joshi
M. Selim Ünlü
Published in:
IEEE Access (2020)
Keyphrases
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integrated circuit
electron beam
printed circuit boards
viewpoint
higher level
efficient implementation
imaging conditions
low cost
single image
structured data
illumination invariant