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LFSR/SR Pseudo-Exhaustive TPG in Fewer Test Cycles.

Dimitrios KagarisSpyros Tragoudas
Published in: DFT (1999)
Keyphrases
  • neural network
  • machine learning
  • search algorithm
  • data mining
  • test data
  • e learning
  • image segmentation
  • similarity measure
  • test cases
  • efficient implementation
  • image super resolution