Sign in

Testbench on a Chip: A Yield Test Vehicle for Resistive Memory Devices.

Luke R. UptonGuénolé LallementMichael D. ScottJoyce TaylorRobert M. RadwayDennis RichMark NelsonSubhasish MitraBoris Murmann
Published in: ISQED (2023)
Keyphrases
  • high density
  • high speed
  • mobile devices
  • low cost
  • pedestrian detection
  • memory usage
  • vehicle speed
  • analog vlsi
  • real time
  • memory requirements
  • test cases
  • embedded systems
  • memory space
  • multithreading
  • memory subsystem