Erratum to "Distance metric learning by knowledge embedding" [Pattern Recognition 37(1)161-163(2004)].
Yungang ZhangChangshui ZhangDavid ZhangPublished in: Pattern Recognit. (2004)
Keyphrases
- pattern recognition
- distance metric learning
- knowledge base
- nonlinear dimensionality reduction
- distance metric
- domain knowledge
- metric learning
- image processing
- prior knowledge
- image classification
- machine learning
- computer vision
- support vector machine svm
- background knowledge
- semi supervised
- vector space
- multi class
- feature vectors
- preprocessing