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Investigation of parasitic bipolar transistor in rail-based electrostatic discharge (ESD) protection circuits.
Pengyu Lai
Xianrui Li
Hui Wang
Zhong Chen
Published in:
IEICE Electron. Express (2019)
Keyphrases
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high speed
low power
real time
positive and negative
power dissipation
field effect transistors
circuit design
high density
integrated circuit
data protection
information security
floating gate
shift register
fault diagnosis
focal plane
cmos technology