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Test Set Generation with a Large Number of Unspecified Bits Using Static and Dynamic Techniques.

Stelios NeophytouMaria K. Michael
Published in: IEEE Trans. Computers (2010)
Keyphrases
  • test set
  • error rate
  • training set
  • training data
  • image processing
  • test data
  • database
  • learning algorithm
  • learning problems
  • random selection