Test Generation Approach for Post-Silicon Validation of High End Microprocessor.

Satish Kumar Sadasivam Sangram Alapati Varun Mallikarjunan

Published in: DSD (2012)

Keyphrases

high end
test generation
high speed
test cases
frame rate
computer systems
computing systems
quality assurance
software testing
processing units
static analysis
mobile devices
file system
low cost
parallel programming
data processing
image sequences