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Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies.

Zhangcai HuangAtsushi KurokawaMasanori HashimotoTakashi SatoMinglu JiangYasuaki Inoue
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
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