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Time-domain performance bound analysis for analog and interconnect circuits considering process variations.

Tan YuSheldon X.-D. TanYici CaiPuying Tang
Published in: ASP-DAC (2014)
Keyphrases
  • high speed
  • statistical analysis
  • analog vlsi
  • data sets
  • neural network
  • real world
  • expert systems
  • image analysis
  • worst case
  • frequency domain