Special issue on Best of Biometrics 2015.
Massimo TistarelliJ. Ross BeveridgePatrick J. FlynnMichele NappiPublished in: Image Vis. Comput. (2017)
Keyphrases
- special issue
- ecml pkdd
- human identification
- pattern recognition
- international journal
- ai edam
- special section
- biometric data
- biometric authentication
- facial recognition
- biometric systems
- applied intelligence
- personal identification
- identity verification
- gait recognition
- person identification
- neural network
- iris recognition
- online learning
- face recognition