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Experts
- Christoph Busch
- Julian Fiérrez
- Rubén Vera-Rodríguez
- Christian Rathgeb
- Kevin W. Bowyer
- Mark S. Nixon
- Patrick J. Flynn
- Aythami Morales
- Wasfy B. Mikhael
- Arun Ross
- Moi Hoon Yap
- Sébastien Marcel
- Jean-Luc Dugelay
- Stanislav Jendrol'
- Rama Chellappa
- Rubén Tolosana
- Charlie D. Frowd
- Damon L. Woodard
- John See
- Massimo Tistarelli
- Gee-Sern Hsu
- Stefanos Zafeiriou
- Anil K. Jain
- Mahdi Ghafourian
- Abdenour Hadid
- Riste Skrekovski
- Svetlana N. Yanushkevich
- P. Jonathon Phillips
- Mayank Vatsa
- Richa Singh
- David Zhang
- Zhenan Sun
- Ran He
- Abhijeet Ghosh
- Hatef Otroshi-Shahreza
- Karl Ricanek
- Dimitrios Hatzinakos
- Dailé Osorio Roig
- Tieniu Tan
Venues
- CoRR
- Multim. Tools Appl.
- IEEE Access
- FG
- IJCB
- ICIP
- Sensors
- Pattern Recognit. Lett.
- BIOSIG
- ICPR
- ICASSP
- CVPR Workshops
- CVPR
- Pattern Recognit.
- BTAS
- IEEE Trans. Inf. Forensics Secur.
- IWBF
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- IEEE Trans. Pattern Anal. Mach. Intell.
- Neurocomputing
- IET Biom.
- MWSCAS
- EUSIPCO
- Image Vis. Comput.
- Comput. Secur.
- ACM Multimedia
- ICB
- Int. J. Biom.
- AAAI
- WACV
- 计算机科学
- Comput. Law Secur. Rev.
- NeuroImage
- Mach. Vis. Appl.
- Int. J. Pattern Recognit. Artif. Intell.
- CogSci
- IEEE Trans. Biom. Behav. Identity Sci.
- IEEE Trans. Affect. Comput.
- SMC
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