FACIAL RECOGNITION
Experts
- Christoph Busch
- Julian Fiérrez
- Rubén Vera-Rodríguez
- Christian Rathgeb
- Kevin W. Bowyer
- Mark S. Nixon
- Aythami Morales
- Patrick J. Flynn
- Wasfy B. Mikhael
- Arun Ross
- Jean-Luc Dugelay
- Moi Hoon Yap
- Charlie D. Frowd
- Damon L. Woodard
- Rubén Tolosana
- Sébastien Marcel
- Rama Chellappa
- John See
- Stanislav Jendrol'
- Massimo Tistarelli
- Stefanos Zafeiriou
- Anil K. Jain
- Riste Skrekovski
- Mahdi Ghafourian
- Abdenour Hadid
- Svetlana N. Yanushkevich
- Gee-Sern Hsu
- P. Jonathon Phillips
- Nasser M. Nasrabadi
- Dailé Osorio Roig
- Zhenan Sun
- Ran He
- Dimitrios Hatzinakos
- Abhijeet Ghosh
- Karl Ricanek
- Mayank Vatsa
- Tieniu Tan
- Richa Singh
- David Zhang
Venues
- CoRR
- IEEE Access
- Multim. Tools Appl.
- FG
- ICIP
- Sensors
- Pattern Recognit. Lett.
- BIOSIG
- ICPR
- CVPR Workshops
- CVPR
- IJCB
- BTAS
- Pattern Recognit.
- IEEE Trans. Inf. Forensics Secur.
- ICASSP
- IEEE Trans. Pattern Anal. Mach. Intell.
- EMBC
- Neurocomputing
- IET Biom.
- IWBF
- MWSCAS
- EUSIPCO
- Image Vis. Comput.
- Int. J. Biom.
- ICB
- Comput. Secur.
- ACM Multimedia
- 计算机科学
- WACV
- Mach. Vis. Appl.
- NeuroImage
- Comput. Law Secur. Rev.
- IEEE Trans. Biom. Behav. Identity Sci.
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Trans. Image Process.
- IEEE Trans. Affect. Comput.
- SMC
- ACM Trans. Graph.
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