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Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling.

Leon Li-Yang ChenKatherine Shu-Min LiXu-Hao JiangSying-Jyan WangAndrew Yi-Ann HuangJwu E. ChenHsing-Chung LiangChun-Lung Hsu
Published in: ITC (2021)
Keyphrases
  • pattern recognition
  • semi supervised
  • lightweight
  • neural network
  • theoretical framework
  • image processing
  • unlabeled data
  • active learning
  • signal processing
  • main contribution