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Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling.
Leon Li-Yang Chen
Katherine Shu-Min Li
Xu-Hao Jiang
Sying-Jyan Wang
Andrew Yi-Ann Huang
Jwu E. Chen
Hsing-Chung Liang
Chun-Lung Hsu
Published in:
ITC (2021)
Keyphrases
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pattern recognition
semi supervised
lightweight
neural network
theoretical framework
image processing
unlabeled data
active learning
signal processing
main contribution