N × 16 cellular test chips for low-pass filtering large images.

Asko Kananen Mika Laiho Kari Halonen Ari Paasio

Published in: ISCAS (5) (2004)

Keyphrases

low pass filtering
image data
image features
image registration
image analysis
low pass
low pass filter
image segmentation
test images
wavelet transform
signal processing
dct domain