Defect Clustering-Aware Spare-TSV Allocation for 3D ICs.
Shengcheng WangMehdi Baradaran TahooriKrishnendu ChakrabartyPublished in: ICCAD (2015)
Keyphrases
- clustering algorithm
- k means
- clustering method
- cluster analysis
- categorical data
- hierarchical clustering
- data clustering
- self organizing maps
- graph theoretic
- fuzzy clustering
- information theoretic
- machine learning
- outlier detection
- unsupervised learning
- data points
- spectral clustering
- learning algorithm
- real time
- database