Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning.

Dong Xiang Ming-Jing Chen Jia-Guang Sun Hideo Fujiwara

Published in: Asian Test Symposium (2003)

Keyphrases

high quality
artificial intelligence
digital libraries
databases
neural network
machine learning
learning algorithm
search engine
computer vision
website
multi agent
higher quality
test suite
scan data