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Defining SRAM Resistive Defects and Their Simulation Stimuli.

Ad J. van de GoorJ. E. Simonse
Published in: Asian Test Symposium (1999)
Keyphrases
  • simulation model
  • defect detection
  • mathematical model
  • power consumption
  • real time
  • databases
  • real world
  • computer vision
  • simulation environment
  • simulation models
  • database
  • data sets
  • genetic algorithm