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An Embedded All-Digital Circuit to Measure PLL Response.
Dennis Michael Fischette
Alvin Leng Sun Loke
Richard Joseph DeSantis
Gerry R. Talbot
Published in:
IEEE J. Solid State Circuits (2010)
Keyphrases
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digital circuits
similarity measure
finite state machines
functional decomposition
distance measure
information content
analog circuits
genetic algorithm
decision trees
database systems
computational complexity
correlation coefficient
embedded systems
error measure