Login / Signup

A self-test and self-repair approach for analog integrated circuits.

Mouna KarmaniChiraz KhedhiriKa Lok ManTomas KrilaviciusBelgacem HamdiAmir-Mohammad Rahmani
Published in: BCFIC (2012)
Keyphrases
  • integrated circuit
  • built in self test
  • test data
  • databases
  • neural network
  • computing systems
  • printed circuit boards
  • damage assessment
  • digital computer