A Generic Method for Embedded Measurement and Compensation of Process and Temperature Variations in SoCs.
Hung Tien BuiYvon SavariaPublished in: IWSOC (2005)
Keyphrases
- experimental evaluation
- preprocessing
- pairwise
- optimization process
- high accuracy
- classification method
- optimization algorithm
- prior knowledge
- significant improvement
- probabilistic model
- optimization method
- synthetic data
- mutual information
- classification process
- process model
- detection method
- support vector machine svm
- theoretical analysis
- input data
- data sets
- domain specific
- edge detection
- support vector machine
- image processing