Double-Tip Artifact Removal From Atomic Force Microscopy Images.
Yun-feng WangJason I. KilpatrickSuzanne P. Suzi JarvisFrancis M. BolandAnil C. KokaramDavid CorriganPublished in: IEEE Trans. Image Process. (2016)
Keyphrases
- three dimensional
- image database
- image data
- image analysis
- input image
- test images
- image classification
- image collections
- region of interest
- image matching
- ground truth
- edge detection
- rigid body
- segmentation algorithm
- fully automatic
- object recognition
- atomic force microscopy
- multiple images
- satellite images
- original images
- computer graphics
- image annotation
- image understanding
- image features
- image retrieval
- face images
- small number
- image pixels
- position and orientation
- image sharpening
- similarity measure