A PVT aware accurate statistical logic library for high- metal-gate nano-CMOS.
Dhruva GhaiSaraju P. MohantyElias KougianosPriyadarsan PatraPublished in: ISQED (2009)
Keyphrases
- nano scale
- wide range
- cmos technology
- high quality
- statistical analysis
- delay insensitive
- high speed
- highly accurate
- information theoretic
- low cost
- statistical methods
- modal logic
- statistical information
- computationally efficient
- x ray
- classical logic
- high accuracy
- data driven
- chip design
- statistical models
- power consumption
- field effect transistors