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Analysis of Defects and Variations in Embedded Spin Transfer Torque (STT) MRAM Arrays.

Ashwin ChintaluriHelia NaeimiSuriyaprakash NatarajanArijit Raychowdhury
Published in: IEEE J. Emerg. Sel. Topics Circuits Syst. (2016)
Keyphrases
  • transfer learning
  • image analysis
  • knowledge transfer
  • artificial intelligence