Fast WAT test structure for measuring Vt variance based on latch-based comparators.

Kao-Chi Lee Kai-Chiang Wu Chih-Ying Tsai Mango Chia-Tso Chao

Published in: VTS (2017)

Keyphrases

structural information
databases
image processing
standard deviation
database
machine learning
information retrieval
learning algorithm
search engine
knowledge base
website
image segmentation
image sequences
multiscale
correlation coefficient
low power