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Defect Detection Differences between Launch-Off-Shift and Launch-Off-Capture in Sense-Amplifier-Based Flip-Flop Testing.

Haluk Konuk
Published in: VTS (2009)
Keyphrases
  • defect detection
  • statistically significant
  • life cycle
  • control system
  • test cases
  • machine learning
  • feature extraction
  • multi view