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Circuit techniques for dynamic variation tolerance.

Keith A. BowmanJames W. TschanzChris WilkersonShih-Lien LuTanay KarnikVivek DeShekhar Y. Borkar
Published in: DAC (2009)
Keyphrases
  • neural network
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  • case study
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  • search algorithm
  • probabilistic model
  • low power
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