Fault Detection and Classification Using Quality-Supervised Double-Layer Method.
Bing SongHongbo ShiPublished in: IEEE Trans. Ind. Electron. (2018)
Keyphrases
- fault detection
- classification method
- unsupervised learning
- support vector machine svm
- pattern recognition
- classification accuracy
- support vector machine
- learning algorithm
- supervised classification
- feature set
- genetic programming
- evolutionary algorithm
- constraint satisfaction problems
- fault diagnosis
- decision trees
- decision making
- neural network