Diagnostic Test Pattern Generation for Sequential Circuits.
Ismed HartantoVamsi BoppanaJanak H. PatelW. Kent FuchsPublished in: VTS (1997)
Keyphrases
- high speed
- analog vlsi
- logic circuits
- medical diagnosis
- diagnostic knowledge
- diagnostic reasoning
- expert systems
- vlsi circuits
- decision making
- sequential search
- diagnostic tool
- diagnostic systems
- delay insensitive
- data sets
- low power
- data mining
- logic synthesis
- diagnostic tests
- electronic circuits
- disease diagnosis
- analog circuits
- circuit design
- model based diagnosis