Generalized indirect S-parameter measurement method of n-ports circuit using T-parameter of (m, n)-ports fixture.
Yuya KojimaToshikazu SekineYasuhiro TakahashiPublished in: ECCTD (2017)
Keyphrases
- synthetic data
- significant improvement
- segmentation method
- linear model
- high accuracy
- computational complexity
- pairwise
- prior knowledge
- dynamic programming
- experimental evaluation
- computational cost
- input data
- detection method
- clustering method
- optimization method
- optimization algorithm
- parameter space
- parameter settings
- optimal parameters
- single parameter
- initial values
- classification method
- detection algorithm
- data sets
- support vector machine
- optical flow
- similarity measure
- face recognition